SLAOUI A.

Publications

Articles répertoriés avec comité de lecture (Actes de conférences précisés)

• Determination of the optical properties and size dispersion of Si nanoparticles within a dielectric matrix by spectroscopic ellipsometry
  KEITA A.S., EN NACIRI A., BATTIE Y., DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A.
  Journal of Applied Physics 116, 10, 1-12 (2014)
• Ellipsometric demonstration of the existence of a strong correlation between size distribution and optical responses of silicon nanoclusters in a nitride matrix
  KEITA A.S., EN NACIRI A., DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A.
  Applied Physics Letters 99, 131903, (2011)
• Dielectric functions of PECVD-grown silicon nanoscale inclusions within rapid thermal annealed silicon-rich silicon nitride films
  KEITA A.S., EN NACIRI A., DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A., STCHAKOVSKY M.
  (acte de conférence ICSE-V) - Thin Solid Films 519, 9, 2870-2873 (2011)
• Spectroscopic ellipsometry investigation of the optical properties of nanostructured Si/SiNx films
  KEITA A.S., EN NACIRI A., DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A.
  Journal of Applied Optics 107, 093516, (2010)
• Dielectric functions of Si nanoparticles within a silicon nitride matrix
  KEITA A.S., EN NACIRI A., DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A.
  (acte de conférence ICFSI-12) - Physica Status Solidi C 7, 2, 418-422 (2010)

Communications orales dans un congrès national ou international

• Ellipsometry sensitivity to the size distribution of Si nanocrystals
  KEITA A.S., EN NACIRI A., BATTIE Y., FERBLANTIER G., SLAOUI A.
  7th International Conference on Surfaces, Coatings and Nanostructured Materials", NANOSMAT-7, 22-25 September , Granada, Spain (2013)
• Spectroscopic ellipsometry analysis of silicon-rich silicon nitride layers for PV applications
  DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A., KEITA A.S., EN NACIRI A., KLOUL M., YAN L., UPPIREDDI K.
  IEEE Nano conference 2011, 15-18 aout 2011, Portland, Oregon, USA (2011)
• Physical properties of nanostructured Si within a SiNx matrix by spectroscopic ellipsometry
  KEITA A.S., EN NACIRI A., DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A.
  6th Workshop ellipsometry, 21-24 fevrier 2011, Berlin, Allemagne (2011)
• Spectroscopic ellipsometry study of nanostructured Si within a SiNx matrix
  KEITA A.S., EN NACIRI A., DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A.
  5th International Conference on Surfaces, Coatings and Nanostructured Materials", NANOSMAT-5, 18-21 October 2010, Reims, France (2010)
• Spectroscopic ellipsometry study of the optical properties of PECVD-grown nanoscale silicon within a silicon nitride matrix
  KEITA A.S., EN NACIRI A., DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A.
  EMRS2010 (European Materials Research Society), 7-11 juin à Strasbourg (2010)