KLOUL M.
Publications
Communications orales dans un congrès national ou international
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Spectroscopic ellipsometry analysis of silicon-rich silicon nitride layers for PV applications
DELACHAT F., CARRADA M., FERBLANTIER G., SLAOUI A., KEITA A.S., EN NACIRI A., KLOUL M., YAN L., UPPIREDDI K.
IEEE Nano conference 2011, 15-18 aout 2011, Portland, Oregon, USA (2011)