La spectrométrie photoélectronique X (XPS) appliquée à l'analyse de matériaux
Lieu:
ICPM à 14h00 - Salle 6 - Metz technopole
Date:
14/12/2021
Organisateur(s):
présenté par Pr. Ivan Zhidkov, de l'Ural Federal University (UrFU) en Russie
Type de manifestation:
Séminaire
Descriptif:
X-ray photoelectron spectroscopy as a tool of materials analysis
The seminar will discuss the basic principles of the XPS method, including the limitations and difficulties arising in the measurement and analysis of spectra. The main part of the seminar will be devoted to the application of the XPS technique for the study of new materials, such as biocompatible coatings, semiconductors, hybrid perovskites, etc. The approaches to the analysis of various types of materials will be outlined using the example of real systems
Contact:
David GONZALEZ-RODRIGUEZ